Master Thesis (f/m/x)
Publicada el 2026-07-19
Descripción de la oferta
Introduction As advanced semiconductor technologies continue to scale, SRAM arrays and register files become increasingly susceptible to radiation-induced soft errors. These transient faults can lead to Silent Data Corruption (SDC), one of the most critical reliability challenges in modern processors. Existing Soft Error Rate (SER) estimation techniques often rely on static assumptions, simplified analytical models, or fault injection campaigns that do not accurately represent the behavior of r…
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Fuente original: adzuna:de